TEST CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE USING THE SAME

摘要

PURPOSE: A test circuit and a semiconductor memory device having the same are provided to supply a test mode for setting optimized sensing speed and sensing sensitivity by adjusting an inclination of first and second sense amp bias voltages according to first and second test mode signals. CONSTITUTION: A first driving part(30) pulls up and drives a first sense amplifier bias voltage in response to a first test signal and a first control signal. A second driver part(32) pulls down and drives a second sense amplifier bias voltage in response to a second test signal and a second controlling signal. The first driving part comprises a transfer device transferring the first control signal in response to the first test signal.