PROBE AND PROBE CARD HAVING THE SAME

摘要

PURPOSE: A probe and a probe card including the same are provided to control the number of semiconductors to be inspected through one inspection process by corresponding to the variation of the number of semiconductor devices. CONSTITUTION: A body unit(411) is extended to one direction. A first support unit(412) is bended and extended from one end of the body unit. A beam unit(413) is separated from the first support unit and is bended and extended from one end of the body unit. A tip unit(414) is bended and extended from the end of the beam unit. A second support unit(415) faces the first support unit. An elastic unit(416) is bended and extended from the second support unit once or more. An interposer unit(417) is bended and extended to an opposite direction from the end of the elastic unit.