发明名称 |
METHOD FOR MEASURING EXPANSION/CONTRACTION, METHOD FOR PROCESSING SUBSTRATE, METHOD FOR PRODUCING DEVICE, APPARATUS FOR MEASURING EXPANSION/CONTRACTION, AND APPARATUS FOR PROCESSING SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and a device for measuring expansion/contraction state of an expandable/contractible substrate highly accurately. SOLUTION: The expansion/contraction measuring apparatus includes a transport section which transfers any flexible substrate along its surface; a detecting section formed on the substrate at certain intervals along the transfer direction of the substrate to detect a first and a second marks respectively relocated in a first and a second detection areas on the transfer route of this substrate along with its transportation; a substrate length setting section for setting the length of substrate along the transfer route between these first and second detection areas to reference length; and a deriving section which derives flexibility information on the transfer direction of the substrate based on the detection results of those first and second marks. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010101878(A) |
申请公布日期 |
2010.05.06 |
申请号 |
JP20090203590 |
申请日期 |
2009.09.03 |
申请人 |
NIKON CORP |
发明人 |
KIUCHI TORU;MIZUTANI HIDEO |
分类号 |
G01B11/16 |
主分类号 |
G01B11/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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