发明名称 CARBON-BASED MEMORY ELEMENTS EXHIBITING REDUCED DELAMINATION AND METHODS OF FORMING THE SAME
摘要 A method of forming a reversible resistance-switching metal-insulator-metal (“MIM”) stack is provided, the method including forming a first conducting layer comprising a degenerately doped semiconductor material, and forming a carbon-based reversible resistance-switching material above the first conducting layer. Other aspects are also provided.
申请公布号 US2010102291(A1) 申请公布日期 2010.04.29
申请号 US20090604178 申请日期 2009.10.22
申请人 SANDISK 3D LLC 发明人 XU HUIWEN
分类号 H01L45/00;H01L21/28 主分类号 H01L45/00
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