发明名称 WAFER-LEVEL INTERCONNECT FOR HIGH MECHANICAL RELIABILITY APPLICATIONS
摘要 An interconnect structure comprises a solder including nickel (Ni) and tin (Sn), with the nickel in a range of 0.01 to 0.20 percent by weight. The interconnect structure further includes an intermetallic compound (IMC) layer in contact with the solder. The (IMC) layer comprises a compound of copper and nickel.
申请公布号 EP2070109(A4) 申请公布日期 2010.04.14
申请号 EP20070873520 申请日期 2007.10.05
申请人 FLIPCHIP INTERNATIONAL L.L.C. 发明人 CURTIS, ANTHONY;BURGESS, GUY, F.;JOHNSON, MICHAEL;TESSIER, TED;YU, YUAN
分类号 B23K35/26;H01L23/485 主分类号 B23K35/26
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