Handler comprising an acceleration device for testing electronic components

摘要

The technology herein relates to a handler for testing electronic components, said handler comprising an acceleration device provided with a tappet which is linearly guided by means of at least one flat spring comprising two groups of spring arms, one group being fixed to the tappet and the other group to a frame which is stationary in relation to a housing of the movement generation device. Handler comprising an acceleration device for testing electronic components.