发明名称 |
Method for high speed sensing for extra low voltage DRAM |
摘要 |
A method and apparatus are provided for sensing in low voltage DRAM memory cells. A method according to one embodiment includes: providing a DRAM circuit having a memory cell, a sense amplifier including a pre-charge circuit connected to a first voltage source and a back-to-back inverter including a first and second NMOS transistor, each having a source and a first and second PMOS transistor, each having a source. The method further includes the steps of maintaining the voltage of the sources of the first and second NMOS transistors at a first voltage during normal operation and lowering the voltage of the sources of the first and second NMOS transistors from the first voltage to a second voltage during a read operation.
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申请公布号 |
US7663953(B2) |
申请公布日期 |
2010.02.16 |
申请号 |
US20070684811 |
申请日期 |
2007.03.12 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
CHENG HANK;HSIEH CHEN-HUI;CHOU CHUNG-CHENG |
分类号 |
G11C7/00 |
主分类号 |
G11C7/00 |
代理机构 |
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