发明名称 APPARATUS FOR MEASUREMENT OF SILICON CONCENTRATION
摘要 <p>The object aims to detect a trace quantity of silicon contained in a solution of interest by a simple means.  Thus, disclosed is an apparatus (1) for measuring the concentration of silicon in a solution of interest, which comprises an excitation light irradiation unit (2) for irradiating the solution with an excitation light for silicon, a light detection unit (3) for detecting a fluorescent light and/or a scattered light emitted from silicon in the solution upon the irradiation with the excitation light, and a calculation unit (41) for calculating the concentration of silicon in the solution based on the intensity of the fluorescent light and/or the scattered light.</p>
申请公布号 WO2010013586(A1) 申请公布日期 2010.02.04
申请号 WO2009JP62321 申请日期 2009.07.06
申请人 HORIBA ADVANCED TECHNO,CO.,LTD.;UCHIMURA, KOJI;MATANO, YOSHIRO 发明人 UCHIMURA, KOJI;MATANO, YOSHIRO
分类号 G01N21/64;G01N21/49 主分类号 G01N21/64
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