发明名称 |
APPARATUS FOR MEASUREMENT OF SILICON CONCENTRATION |
摘要 |
<p>The object aims to detect a trace quantity of silicon contained in a solution of interest by a simple means. Thus, disclosed is an apparatus (1) for measuring the concentration of silicon in a solution of interest, which comprises an excitation light irradiation unit (2) for irradiating the solution with an excitation light for silicon, a light detection unit (3) for detecting a fluorescent light and/or a scattered light emitted from silicon in the solution upon the irradiation with the excitation light, and a calculation unit (41) for calculating the concentration of silicon in the solution based on the intensity of the fluorescent light and/or the scattered light.</p> |
申请公布号 |
WO2010013586(A1) |
申请公布日期 |
2010.02.04 |
申请号 |
WO2009JP62321 |
申请日期 |
2009.07.06 |
申请人 |
HORIBA ADVANCED TECHNO,CO.,LTD.;UCHIMURA, KOJI;MATANO, YOSHIRO |
发明人 |
UCHIMURA, KOJI;MATANO, YOSHIRO |
分类号 |
G01N21/64;G01N21/49 |
主分类号 |
G01N21/64 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|