发明名称 PLASMA PROCESSING METHOD
摘要 PURPOSE: A plasma processing method is provided to perform the plasma processing of the high quality about the processed body. CONSTITUTION: The silicon substrate is prepared within the process chamber(102). The silicon oxidation film is formed in the silicon substrate. The nitrogen gas is introduced within the process chamber on the silicon oxide film. Using the antenna member(120), the plasma is generated. Using the plasma, the plasma processing of the silicon substrate is operated. The antenna member includes the slot electrode(200). The slot electrode has a plurality of slits. The gate insulating layer is formed.
申请公布号 KR20100007827(A) 申请公布日期 2010.01.22
申请号 KR20090120493 申请日期 2009.12.07
申请人 TOKYO ELECTRON LIMITED 发明人 HONGO TOSHIAKI;OSAWA TETSU
分类号 B01J19/08;H01L21/205;C23C16/44;C23C16/455;C23C16/511;H01J37/32;H01L21/20;H01L21/302;H01L21/3065;H01L21/31 主分类号 B01J19/08
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