发明名称 METHOD FOR FABRICATING NON-VOLATILE MEMORY DEVICE
摘要 <p>PURPOSE: A method for fabricating non-volatile memory device is provided to easily remove a dielectric film at a peripheral circuit region by forming the dielectric film over a product. CONSTITUTION: A floating gate pattern is formed on a substrate. An oxide film(450) of the prescribed thickness is formed on the peripheral circuit region of the product. The Floating gate pattern is formed on the product. A dielectric film(460) is formed on the whole of an oxidation film-formed product. A protective film(470) is formed on the whole of a dielectric film-formed product. The dielectric film on the peripheral circuit region is removed a planarization process which is performed until the hard mask layer(430) is exposed to the outside.</p>
申请公布号 KR20100006388(A) 申请公布日期 2010.01.19
申请号 KR20080066597 申请日期 2008.07.09
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHIN, SEUNG A
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
代理机构 代理人
主权项
地址