发明名称 APPARATUS AND METHOD FOR MEASURING RADIATION ENERGY DURING THERMAL PROCESSING
摘要 Embodiments of the present invention provide apparatus and method for reducing heating source radiation influence in temperature measurement during thermal processing. In one embodiment of the present invention, background radiant energy, such as an energy source of a thermal processing chamber, is marked within a selected spectrum, a characteristic of the background is then determined by measuring radiant energy at a reference wavelength within the selected spectrum and a comparing wavelength just outside the selected spectrum.
申请公布号 US2010003020(A1) 申请公布日期 2010.01.07
申请号 US20090483084 申请日期 2009.06.11
申请人 APPLIED MATERIALS, INC. 发明人 RANISH JOSEPH M.;KOELMEL BLAKE;HUNTER AARON
分类号 A21B2/00 主分类号 A21B2/00
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