发明名称 |
SUBSTRATE TREATING APPARATUS AND METHOD FOR SELECTIVELY ETCHING A SUBSTRATE SURFACES |
摘要 |
PURPOSE: A substrate treating apparatus and method for selectively etching a substrate surfaces are provided to control the etching consume rate about inside of substrate the intended region. CONSTITUTION: The substrate processing apparatus(1) comprises the spin head(130) and the first nozzle(210). The spin head revolves while supporting the substrate (W). The first nozzle of the etchant is formed on the top of the substrate. The substrate processing apparatus more includes the second nozzle(220) and controller(240). The second nozzle of the etching disturbance fluid is formed on the top of the substrate. The controller respectively positions the first and second nozzles in center and peripheral areas of substrate.
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申请公布号 |
KR20100000266(A) |
申请公布日期 |
2010.01.06 |
申请号 |
KR20080059697 |
申请日期 |
2008.06.24 |
申请人 |
SEMES CO., LTD. |
发明人 |
LEE, BOK KYU;CHOI, JONG SU;KANG, JUN KEE |
分类号 |
H01L21/3063;H01L21/302 |
主分类号 |
H01L21/3063 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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