发明名称 METHOD FOR FORMING COPPER WIRING
摘要 <p>A method of forming a primary coat, which consists of a V- or Ti-containing film, formed on the surface of a subject on which holes or the like have been formed, according to the CVD technique, while using, for instance, a tetravalent amide-type vanadium-containing organometal compound as a raw gas and using, for instance, tertiary butyl hydrazine as a reducing gas, and a copper-containing film is then formed on the primary coat, according to the CVD technique, to thus fill the holes or the like with the copper-containing film and to thus form copper distributing wire, which is excellent in the hole-filling properties and excellent in the adhesion to a primary coat, this process can be applied to the field of copper distributing wires used in the semiconductor industries.</p>
申请公布号 KR100934888(B1) 申请公布日期 2010.01.06
申请号 KR20087025866 申请日期 2005.09.12
申请人 发明人
分类号 H01L21/3205 主分类号 H01L21/3205
代理机构 代理人
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