发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device and a method of manufacturing the semiconductor device maintain an insulating distance between contact plugs and wiring lines formed on the contact plugs by using an etch mask pattern for forming contact holes. The device comprises a substrate comprising a plurality of conductive areas; an inter-layer insulating layer on the substrate having a plurality of contact holes through which the conductive areas are exposed; a first insulating layer covering the top surface of the inter-layer insulating layer; a plurality of contact plugs respectively connected to the plurality of conductive areas through the plurality of contact holes, the plurality of contact plugs having top surfaces a distance from each of which to a top surface of the substrate is less than a distance from the top surface of the inter-layer insulating layer to the top surface of the substrate; a plurality of ring-shaped insulating spacers covering inner sidewalls of the inter-layer insulating layer, inner sidewalls of the first insulating layer, and outer edge areas of top surfaces of the contact plugs so as to expose center areas of the top surfaces of the contact plugs in the contact holes; and a plurality of wiring lines above the first insulating layer and on the insulating spacers and respectively electrically connected to the plurality of contact plugs.
申请公布号 US2009321931(A1) 申请公布日期 2009.12.31
申请号 US20080313234 申请日期 2008.11.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE YOUNG-HO;SIM JAE-HWANG;PARK JAE-KWAN
分类号 H01L23/52 主分类号 H01L23/52
代理机构 代理人
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