发明名称 METHOD OF FORMING PATTERN
摘要 Disclosed is a method of forming a pattern. A first organic polymer layer is formed on a substrate on which an underlying layer, and then a second organic polymer layer, which has an opening partially exposing the first organic polymer layer, is formed on the first organic polymer layer. Next, a silicon-containing polymer layer is formed on the second organic polymer layer to cover the opening. The silicon-containing polymer layer is oxidized and simultaneously the second organic polymer layer and the first organic polymer layer are ashed by oxygen plasma to form a pattern having an anisotropy-shape. The underlying layer is etched using the silicon-containing polymer layer and the first organic polymer layer as an etching mask to form a pattern.
申请公布号 US2009291561(A1) 申请公布日期 2009.11.26
申请号 US20090511538 申请日期 2009.07.29
申请人 KOH CHA-WON;WOO SANG-GYUN;YEO GI-SUNG;JUNG MYOUNG-HO 发明人 KOH CHA-WON;WOO SANG-GYUN;YEO GI-SUNG;JUNG MYOUNG-HO
分类号 H01L21/3065;G03F7/00;G03F7/075;G03F7/11;G03F7/40;H01L21/027;H01L21/033;H01L21/306;H01L21/311 主分类号 H01L21/3065
代理机构 代理人
主权项
地址
您可能感兴趣的专利