发明名称 SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device that can effectively prevent migration of charges between adjacent memory cells. SOLUTION: A semiconductor device includes a tunnel insulating film 21 formed on a semiconductor substrate 11, a charge storage insulating film 22 formed on the tunnel insulating film and including at least two separated low oxygen concentration portions 22a and a high oxygen concentration portion 22b positioned between the adjacent low oxygen concentration portions and having a higher oxygen concentration than the low oxygen concentration portions, a charge block insulating film 23 formed on the charge storage insulating film, and control gate electrodes 24 formed on the charge block insulating film and above the low oxygen concentration portions. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009260070(A) 申请公布日期 2009.11.05
申请号 JP20080108048 申请日期 2008.04.17
申请人 TOSHIBA CORP 发明人 OZAWA YOSHIO;FUJITSUKA RYOTA
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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