发明名称 |
METHOD AND APPARATUS FOR MEASURING SIGNAL QUALITY USING EYE PATTERN |
摘要 |
A SIGNAL QUALITY MEASURING METHOD AND APPARATUS IN WHICH A QUALITY OF A SIGNAL DETECTED FROM AN RF SIGNAL READ OUT FROM A DISK OR A COMMUNICATIONS CHANNEL IS MEASURED BY USING EYE PATTERN SIGNALS OF THE DETECTED RF SIGNALS. EYE PATTERN SIGNALS REPRESENTING TIME CHANGE OF A WAVEFORM OF THE DETECTED SIGNAL ARE GENERATED AND A SIGNAL QUALITY VALUE IS GENERATED BASED ON AN EYE DEPTH AND/OR AN EYE WIDTH MEASURED FROM THE EYE PATTERN SIGNALS. A HISTOGRAM (511) OF THE EYE PATTERN SIGNALS IS USED TO IDENTIFY A PLURALITY OF MAIN LEVEL VALUES WHICH ARE USED AS A REFERENCE VALUE IN MEASURING THE SIGNAL QUALITY. ACCORDINGLY, SIGNAL CHARACTERISTICS IN A HIGH-DENSITY STORAGE MEDIUM SYSTEM OR COMMUNICATION SYSTEM MAY BE ACCURATELY REPRESENTED.
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申请公布号 |
MY139465(A) |
申请公布日期 |
2009.10.30 |
申请号 |
MYPI20043794 |
申请日期 |
2004.09.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
EING-SEOB CHO;JAE-SEONG SHIM;HYUN-SOO PARK;JAE-WOOK LEE;JUNG-HYUN LEE;EUN-JIN RYU |
分类号 |
G11B20/10;G06F19/00;H04L1/20 |
主分类号 |
G11B20/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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