发明名称 MACRO INSPECTION DEVICE, MACRO INSPECTION SYSTEM, AND MACRO INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To transfer a planar board to a macro inspection device in a short time without limiting the position and constitution of a holder concerning the macro inspection device, a macro inspection system, and a macro inspection method. SOLUTION: The macro inspection device 1 having the holder 3 capable of changing-over an inspection angle with respect to an inspector 10 includes a board support member 2 for scooping and supporting the planar board 6. The planar board 6 is fixed to the holder 3 in a scooped state by the support member 2. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009231437(A) 申请公布日期 2009.10.08
申请号 JP20080073364 申请日期 2008.03.21
申请人 OLYMPUS CORP 发明人 NISHIZAWA MAKOTO
分类号 H01L21/683;B05C11/00;B65G49/06;G09F9/00 主分类号 H01L21/683
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