发明名称 INSPECTION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a compact inspection system for reading a one-dimensional bar code provided on a microchip by a simple structure. Ž<P>SOLUTION: The inspection system is characterized by comprising: a chip conveying tray structured so as to be movable between a first position allowing the microchip to be mounted therein and a second position allowing reaction results to be measured from the microchip mounted therein; the bar code made up of black bars and white bars and provided on the microchip; a chip-conveying-tray drive means for moving the conveying tray; and a bar-code photo receiving part for sequentially receiving light from the black bars or light from the white bars to convert it into an electrical signal while the drive means moves the conveying tray with the microchip mounted thereon. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009229264(A) 申请公布日期 2009.10.08
申请号 JP20080075505 申请日期 2008.03.24
申请人 KONICA MINOLTA MEDICAL & GRAPHIC INC 发明人 SUGINAGA OSAMI
分类号 G01N35/00;G01N35/02;G01N35/04;G01N37/00 主分类号 G01N35/00
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