| 摘要 |
An excitation light beam of a wavelength that excites fluorescent labels and a reference light beam having a wavelength longer than the excitation light beam are irradiated through a dielectric block toward an interface between the dielectric block and a metal film, to cause a first electric field enhancing field and a second electric field enhancing field on the upper surface of the metal film, in fluorescence detection that utilizes surface plasmon. The intensity of scattered light of the second electric field enhancing field, which is substantially proportionate to the intensity of the second electric field enhancing field, is employed to normalize and correct the intensity of fluorescence emitted by fluorescent labels with respect to the intensity of the first electric field enhancing field, based on the relationship between the intensities of the first and second electric field enhancing fields.
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