发明名称 |
Test time reduction algorithm |
摘要 |
Exemplary embodiments provide a method and system for reducing test time for electronic devices. The method and system aspects include receiving a test data file containing results from a set of tests run on a first set of devices; determining a frequency of failure metric for each of the tests from the test data file; classifying each one of the tests as redundant or necessary based on the frequency of failure metric determined for each of the tests; and creating a reduced set of tests that includes the necessary test but does not include the redundant tests.
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申请公布号 |
US7596731(B1) |
申请公布日期 |
2009.09.29 |
申请号 |
US20070655368 |
申请日期 |
2007.01.19 |
申请人 |
MARVELL INTERNATIONAL LTD. |
发明人 |
SHARMA MONIKA |
分类号 |
G06F11/00;G01R31/26;G01R31/28 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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