UNTERSTÜTZUNG VON KALIBRATION UND DIAGNOSE IN EINEM TESTSYSTEM MIT OFFENER ARCHITEKTUR,申请号DE200560015964T-传众专利搜索

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发明名称	UNTERSTÜTZUNG VON KALIBRATION UND DIAGNOSE IN EINEM TESTSYSTEM MIT OFFENER ARCHITEKTUR
摘要
申请公布号	DE602005015964(D1)	申请公布日期	2009.09.24
申请号	DE200560015964T	申请日期	2005.05.23
申请人	ADVANTEST CORP.	发明人	ADACHI, TOSHIAKI;PRAMANICK, ANKAN;ELSTON, MARK
分类号	G01R31/319	主分类号	G01R31/319
代理机构		代理人
主权项
地址

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