SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To reduce test cost by using a simple test pattern to perform a test of a circuit operated upon receiving the output of a functional block.

SOLUTION: A data input unit receives an input data signal to be supplied to an external data input terminal. A storage unit stores the input data signal received by the data input unit. A timing generating unit generates a timing signal in response to an output request signal. A data output unit outputs the input data signal stored in the storage unit as an output data signal in synchronization with the timing signal. A test output control unit outputs the input data signal received by the data input unit in synchronization with the timing signal. A data selector outputs the output data signal from the data output unit to the external data output terminal in a normal operation mode, or outputs the input data signal from the test output control unit to the external data output terminal in a test mode.

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