发明名称 |
APPARATUS FOR MEASUREMENT OF PARAMETERS |
摘要 |
In the case of an apparatus for measurement of parameters, in particular strains, temperatures, concentration and composition of gases, magnetic or electrical fields having a structure element (1), the structure element (1) is intended to be formed essentially from plastic and to be at least partially in the form of a sensor structure (9). |
申请公布号 |
WO2009059774(A3) |
申请公布日期 |
2009.08.13 |
申请号 |
WO2008EP09386 |
申请日期 |
2008.11.07 |
申请人 |
WITTENSTEIN AG;WROBEL, MIROSLAW;HAAG, HEIKO |
发明人 |
WROBEL, MIROSLAW;HAAG, HEIKO |
分类号 |
G01L3/10;G01L1/22 |
主分类号 |
G01L3/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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