发明名称 APPARATUS FOR MEASUREMENT OF PARAMETERS
摘要 In the case of an apparatus for measurement of parameters, in particular strains, temperatures, concentration and composition of gases, magnetic or electrical fields having a structure element (1), the structure element (1) is intended to be formed essentially from plastic and to be at least partially in the form of a sensor structure (9).
申请公布号 WO2009059774(A3) 申请公布日期 2009.08.13
申请号 WO2008EP09386 申请日期 2008.11.07
申请人 WITTENSTEIN AG;WROBEL, MIROSLAW;HAAG, HEIKO 发明人 WROBEL, MIROSLAW;HAAG, HEIKO
分类号 G01L3/10;G01L1/22 主分类号 G01L3/10
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