发明名称 Semiconductor Memory Device that uses less channel when it's under test
摘要 <p>A semiconductor memory device includes a plurality of memory banks, a data pin for inputting and outputting data, and input/output buffers connected to the data pin. Each of the memory banks has a plurality of memory cells for storing the data. The data pin is enabled and disabled by a pin selection signal. The data pin performs a normal data input/output operation when the pin selection signal is enabled and a termination resistor connected to the data pin is off when the pin selection signal is disabled. The input/output buffers make a termination resistor connected to the data pin off when the pin selection signal is disabled.</p>
申请公布号 KR100910869(B1) 申请公布日期 2009.08.06
申请号 KR20070055965 申请日期 2007.06.08
申请人 发明人
分类号 G11C29/00 主分类号 G11C29/00
代理机构 代理人
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