发明名称 JITTER TRANSFER CHARACTERISTIC MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a jitter transfer characteristic measuring device which can find jitter transfer characteristics by a simple circuit configuration while maintaining the independence on temperature characteristics of a filter. SOLUTION: The jitter transfer characteristic measuring device includes a jitter generation block 230 which outputs a clock signal added with jitter to a device to be measured; and a demodulation and analysis block 700 which demodulates and analyzes the jitter of the received output signal. The jitter generation block 230 includes a demodulation signal generator 210 for generating a demodulation signal, a first clock signal generator 200, and a jitter generator 220. The demodulation and analysis block 700 includes a second clock signal generator 400; a jitter demodulation section 410; an A/D converter 500; a digital filter 610 for extracting only the frequency components of a modulated signal; a maximum likelihood estimation section 620 for obtaining the amplitude of an extracted jitter signal by applying an evaluation function along the time axis having the frequency components of the modulated signal to the extracted jitter signal; and a transfer characteristic calculating means 630 for calculating the jitter transfer characteristics from the obtained amplitude. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009171240(A) 申请公布日期 2009.07.30
申请号 JP20080007212 申请日期 2008.01.16
申请人 YOKOGAWA ELECTRIC CORP 发明人 FURUKAWA YASUSHI
分类号 H04L25/02;G01R27/28;G01R29/02 主分类号 H04L25/02
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