| 摘要 |
#CMT# #/CMT# The pointer map (1a,1b) comprises two base bodies (2a,2b), multiple axially relocatable stored pointers (3a,3b), which are arranged on an outer surface of the base body, and a connecting element (4) for receiving the base body. The base body comprises an electric contact interface (5), by which the axially relocatable stored pointers are electrically connected with a testing device. #CMT# : #/CMT# Independent claims are included for the following: (1) a testing device for electronic components; and (2) a method for testing two electronic components. #CMT#USE : #/CMT# Pointer map for electrical contacting of two electronic components, particularly for contacting of two wafers (Claimed). #CMT#ADVANTAGE : #/CMT# The base body comprises an electric contact interface, by which the axially relocatable stored pointers are electrically connected with a testing device, and thus enables a reliable and efficient contacting of the two electronic components. #CMT#DESCRIPTION OF DRAWINGS : #/CMT# The drawing shows a sectional view of a pointer map with pointer contacts. 1a,1b : Pointer map 2a,2b : Base bodies 3a,3b : Pointers 4 : Connecting element 5 : Contact interface. |
