发明名称 GLASS LENS PATTERN SHAPE MEASUREMENT DEVICE
摘要 <p>A measurement probe moving device (6) controls a top edge of a glass lens pattern measurement probe (36) to contact with, and moves on, a refraction surface of a glass lens pattern (Lm) held in the glass lens pattern hold device so as to detect a change from a detection signal of a second position detection device (40) when the glass lens pattern (Lm) is engaged in metal fitting setting holes (104-107) as a relationship between a glass lens pattern circumferential shape and a hole position in accordance with a detection signal from the second position detection device (40).</p>
申请公布号 WO2009078457(A1) 申请公布日期 2009.06.25
申请号 WO2008JP73046 申请日期 2008.12.18
申请人 KABUSHIKI KAISHA TOPCON;HOYA CORPORATION;WATANABE, TAKAHIRO;WATANABE, KENICHI;MIYASHITA, KENJI 发明人 WATANABE, TAKAHIRO;WATANABE, KENICHI;MIYASHITA, KENJI
分类号 G01B5/20;B24B9/14;G02C7/02;G02C13/00 主分类号 G01B5/20
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