发明名称 |
GLASS LENS PATTERN SHAPE MEASUREMENT DEVICE |
摘要 |
<p>A measurement probe moving device (6) controls a top edge of a glass lens pattern measurement probe (36) to contact with, and moves on, a refraction surface of a glass lens pattern (Lm) held in the glass lens pattern hold device so as to detect a change from a detection signal of a second position detection device (40) when the glass lens pattern (Lm) is engaged in metal fitting setting holes (104-107) as a relationship between a glass lens pattern circumferential shape and a hole position in accordance with a detection signal from the second position detection device (40).</p> |
申请公布号 |
WO2009078457(A1) |
申请公布日期 |
2009.06.25 |
申请号 |
WO2008JP73046 |
申请日期 |
2008.12.18 |
申请人 |
KABUSHIKI KAISHA TOPCON;HOYA CORPORATION;WATANABE, TAKAHIRO;WATANABE, KENICHI;MIYASHITA, KENJI |
发明人 |
WATANABE, TAKAHIRO;WATANABE, KENICHI;MIYASHITA, KENJI |
分类号 |
G01B5/20;B24B9/14;G02C7/02;G02C13/00 |
主分类号 |
G01B5/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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