| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve problems that in a configuration having a counter prepared for each diagnostic item, a circuit scale of an integrated circuit is increased, diagnostic items are increased as a function is enhanced and a circuit scale of a self-diagnostic unit is also increased. <P>SOLUTION: A self-diagnostic circuit 103 has a counter configured such that a plurality of types of error detection signals generated in an integrated circuit can be input thereto. The self-diagnostic circuit has also a setting unit 110 for determining a type of an error detection signal input to the counter out of the plurality of types of error detection signals. <P>COPYRIGHT: (C)2009,JPO&INPIT |
