| 摘要 |
PROBLEM TO BE SOLVED: To implement an IC tester capable of maintaining universality in a test head and providing the test head with an analog test module. SOLUTION: The IC tester mounts the analog test module inside the test head and tests an object to be tested. The analog test module comprises: a main board; a first subboard that is connected to the front and rear of the main board by connectors, has a first analog circuit provided on both the surfaces of a first-half region and a first digital circuit provided between both the surfaces of a second-half region and is connected to the first analog circuit electrically, and conducts an analog test; and a second subboard that is connected to a side opposite to the first subboard in the main board in front and behind by connectors, has a second analog circuit on both the surfaces of a first-half region and a second digital circuit provided on both the surfaces of a second-half region and connected to the second analog circuit electrically, and conducts an analog test. COPYRIGHT: (C)2009,JPO&INPIT
|
