WAFER, METHOD OF MANUFACTURING INTEGRATED CIRCUITS ON A WAFER, AND METHOD OF STORING DATA ABOUT SAID CIRCUITS

摘要

The invention discloses a wafer (2), comprising a plurality of integrated circuits (1) formed on the wafer (2); and at least one auxiliary integrated circuit (Ia) formed on the wafer (2); wherein data carrying information about said integrated circuits (1) are stored in said at least one auxiliary integrated circuit (Ia). Examples for said data are test results of a test performed on said individual integrated circuits (1) and/or a wafer identification or a product identification. The invention furthermore discloses a method of manufacturing said integrated circuits (1) and a method of storing said data about said circuits (1a).