发明名称 |
LITHOGRAPHIC APPARATUS, RADIATION SYSTEM, CONTAMINANT TRAP, DEVICE MANUFACTURING METHOD, AND METHOD FOR TRAPPING CONTAMINANTS IN CONTAMINANT TRAP |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a lithographic apparatus including: a radiation system which includes a supply source for generating a radiation beam, a contaminant trap located in a path of the radiation beam, and an illumination system constituted so as to adjust the radiation beam generated by the supply source; and a support section for supporting a patternizing device. <P>SOLUTION: This patternizing device works so that a pattern is given to a cross section of an adjusted radiation beam. The apparatus also includes a substrate table for holding a substrate, and a projection system for projecting a patternized radiation beam on a target portion of the substrate. The contaminant trap includes a plurality of foils, for forming channels disposed almost in parallel to a transmission direction of the radiation beam. This trap includes a gas supply system located so that a gas is injected into at least one of the channels of the trap. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009105442(A) |
申请公布日期 |
2009.05.14 |
申请号 |
JP20090023978 |
申请日期 |
2009.02.04 |
申请人 |
ASML NETHERLANDS BV |
发明人 |
LEVINUS PIETER BAKKER;BANINE VADIM YEVGENYEVICH;LUIJKX CORNELIS PETRUS A M;SCHUURMANS FRANK JEROEN PIETER |
分类号 |
H01L21/027;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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