发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device and the semiconductor device, which can form a contacting plug on a wiring without its faulty conduction. SOLUTION: The semiconductor device manufacturing method includes a process for forming a wiring on a substrate, a process for forming a first film on the wiring, a process for forming a second film on the first film, a process for forming a third film by using a material having a lower etching resistance than that of the second film, on the second film, a process for forming a region including an end portion of the third film and having a film thickness different from that of other than the end portion of the third film, on the second film present above the wiring, a process for forming an inter-layer insulating film on the second or third film, and a process for forming a contacting plug connected with the wiring, in the shape region. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009105279(A) 申请公布日期 2009.05.14
申请号 JP20070276629 申请日期 2007.10.24
申请人 FUJITSU MICROELECTRONICS LTD 发明人 PIDIN SERGEI
分类号 H01L21/768;H01L21/8238;H01L27/092 主分类号 H01L21/768
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