发明名称 Method and apparatus for identifying outlier data
摘要 A method for converting data includes generating a first data vector of data measurements related to processing of at least one workpiece. Each element of the first data vector is associated with at least one of a plurality of positions on the workpiece. A cumulative distribution of the elements in the first data vector is generated. An outlier region of the data measurements is identified based on the cumulative distribution. A binary outlier data vector is generated from the first data vector by assigning a first binary value to the data elements in the first data vector in the outlier region and assigning a second binary value to the remaining data elements in the first data vector.
申请公布号 US7533313(B1) 申请公布日期 2009.05.12
申请号 US20060371771 申请日期 2006.03.09
申请人 ADVANCED MICRO DEVICES, INC. 发明人 RETERSDORF MICHAEL ALAN;MCINTYRE MICHAEL G.
分类号 G01R31/28 主分类号 G01R31/28
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