发明名称 |
Method and apparatus for identifying outlier data |
摘要 |
A method for converting data includes generating a first data vector of data measurements related to processing of at least one workpiece. Each element of the first data vector is associated with at least one of a plurality of positions on the workpiece. A cumulative distribution of the elements in the first data vector is generated. An outlier region of the data measurements is identified based on the cumulative distribution. A binary outlier data vector is generated from the first data vector by assigning a first binary value to the data elements in the first data vector in the outlier region and assigning a second binary value to the remaining data elements in the first data vector.
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申请公布号 |
US7533313(B1) |
申请公布日期 |
2009.05.12 |
申请号 |
US20060371771 |
申请日期 |
2006.03.09 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
RETERSDORF MICHAEL ALAN;MCINTYRE MICHAEL G. |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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地址 |
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