发明名称 Optical characteristic measuring apparatus and measuring method using light reflected from object to be measured
摘要 A measurement-purpose light source generates a measurement light used for measuring an optical characteristic of an object to be measured, and the measurement light includes a component in a wavelength range for measurement of the optical characteristic of the object. An observation-purpose light source generates an observation light used for focusing on the object to be measured and checking a position of measurement. The observation light is selected such that the observation light includes a component that can be reflected from the object to be measured. The measurement light and the observation light are thus applied independently to the object to be measured, through a common objective lens, and accordingly improvement of the precision in measurement of the optical characteristic and facilitation of focusing on the object to be measured are achieved simultaneously.
申请公布号 US7528967(B2) 申请公布日期 2009.05.05
申请号 US20080121287 申请日期 2008.05.15
申请人 OTSUKA ELECTRONICS CO., LTD. 发明人 OKAWAUCHI MAKOTO;MIZUGUCHI TSUTOMU;KAWAGUCHI SHIRO
分类号 G01J3/00;G01N21/55 主分类号 G01J3/00
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