CIRCUIT INTERCONNECT TESTING ARRANGEMENT AND APPROACH THEREFOR,申请号EP20050776475-传众专利搜索

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发明名称	CIRCUIT INTERCONNECT TESTING ARRANGEMENT AND APPROACH THEREFOR
摘要
申请公布号	EP1810044(B1)	申请公布日期	2009.04.29
申请号	EP20050776475	申请日期	2005.07.28
申请人	NXP B.V.	发明人	SCHUTTERT, RODGER, FRANKS;WAAYERS, TOM
分类号	G01R31/3185	主分类号	G01R31/3185
代理机构		代理人
主权项
地址

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