发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 <p>A semiconductor device and a method for manufacturing the same are provided to prevent electrical connection between active regions by suppressing the growth of a source/drain lifted by a lower spacer unit of a gate spacer in a transverse direction. A semiconductor device includes a cell region and a peripheral circuit region. A substrate(100) includes an active region and a field region(105). A gate trench is formed in a part with a word line in the active region. The word line including a gate electrode(115), a silicide film(117), a gate mask(120) and a gate spacer(125) are formed on the gate trench. The gate spacer includes the oxide and/or the silicon nitride. A first contact region(130) and a second contact region(135) are formed by implanting the ion to the substrate between the gate structures by suing a gate mask and a gate spacer. The source and drain(140) is formed on the first and second contact region.</p>
申请公布号 KR20090040989(A) 申请公布日期 2009.04.28
申请号 KR20070106448 申请日期 2007.10.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JIN BUM;LEE, BYEONG CHAN;LEE, SUN GHIL;CHOI, SI YOUNG
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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