发明名称 INSPECTION DEVICE AND INSPECTION METHOD OF ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide an inspection device and an inspection method of an electronic component capable of performing inspection readily and with high accuracy, and of reducing the cost. SOLUTION: This device is equipped with a fixing means 220 for fixing the electronic component 11 provided with a connector 43, having a connection part arranged side by side; a connector 230 for inspection connected to the connecting part by being inserted into the connector 43 and connected to an inspector; and a holding means 240 for movably holding the connector 230 for inspection. The connector 230 for inspection is equipped with a probe pin arranged, side by side and connected electrically to each connection part; and a guide part, provided furthermore protrusively than the tip of the probe pin to both sides, in a direction where the probe pin is arranged side by side, and fitted to the outside of both sides, in a direction where the connection part of the connector is arranged side by side. When the holding means 240 moves the connector 230 for inspection in the insertion direction of the connector 43, the guide part is fitted to the outer periphery of the connector 43, and thereby the connector 230 for inspection is inserted into the connector 43. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009063296(A) 申请公布日期 2009.03.26
申请号 JP20070228610 申请日期 2007.09.04
申请人 SEIKO EPSON CORP 发明人 OTSUKI KIMIYASU
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
主权项
地址