发明名称 DELAY TIME MEASUREMENT CIRCUIT AND METHOD
摘要 Provided are a delay time measurement circuit and method. Since the delay time measurement circuit and method according to the present invention use a delay chain having a feedback structure, a measurable delay time is not limited. In addition, the number of delay elements constituting the delay chain can be reduced, such that the delay time measurement circuit can be implemented in a small layout area.
申请公布号 WO2008156289(A3) 申请公布日期 2009.02.26
申请号 WO2008KR03422 申请日期 2008.06.17
申请人 ATLAB INC.;LEE, BANG-WON;JUNG, DUCK-YOUNG;SHIN, YOUNG-HO;LEE, JEI-HYUK;LEE, JU-MIN 发明人 LEE, BANG-WON;JUNG, DUCK-YOUNG;SHIN, YOUNG-HO;LEE, JEI-HYUK;LEE, JU-MIN
分类号 G01R27/00 主分类号 G01R27/00
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