发明名称 Process and apparatus for measurements of Mueller matrix parameters of polarized light scattering
摘要 A method and apparatus for measuring Mueller matrix parameters from scattered light. The apparatus is advantageous for use in countering bioterrorism by detecting information concerning airborne pathogens, particularly microorganism in aerosol form. The system provided is portable, more efficient, and less sensitive to wavelength changes. The method uses variation in retardation over wavelength as opposed to variation in retardation with time.
申请公布号 US2009033938(A1) 申请公布日期 2009.02.05
申请号 US20080082195 申请日期 2008.03.31
申请人 CZEGE JOZSEF;BRONK BURT V 发明人 CZEGE JOZSEF;BRONK BURT V.
分类号 G01J4/00 主分类号 G01J4/00
代理机构 代理人
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