发明名称
摘要 PROBLEM TO BE SOLVED: To precisely etch a polysilicon layer which is deposited by CVD or the like. SOLUTION: Before the polysilicon layer is deposited, the surface of a substrate 10 and the surface of a gate insulating film 12 formed over it are light-etched. By this, a damaged section and any smudge or the like are removed. So, adhesion property among the substrate 10 or the gate insulating film 12 and the polysilicon layer 2 is improved to prevent an etching liquid or the like from invading there. As a result, the amount of undercutting is reduced for improved precision in the etching. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP4211687(B2) 申请公布日期 2009.01.21
申请号 JP20040165853 申请日期 2004.06.03
申请人 发明人
分类号 G02F1/1368;H01L21/336;H01L21/28;H01L29/417;H01L29/423;H01L29/49;H01L29/786 主分类号 G02F1/1368
代理机构 代理人
主权项
地址