发明名称 Probing apparatus and positional deviation acquiring method
摘要 In a prober, a post-contact image representing a region including a pad is acquired by capturing an image of a substrate after a probe has been brought into contact with the pad having an existing probe mark. An image storage unit stores in advance a pre-contact image representing the pad-inclusive region before the probe is brought into contact with the pad. A latest probe mark position acquiring unit acquires a position of a latest probe mark region created by the contact of the probe with the pad from among a plurality of probe mark regions in the post-contact image respectively corresponding to a plurality of probe marks on the pad by comparing the post-contact image with the pre-contact image. A positional deviation acquiring unit finds a deviation in a contact position of the probe with respect to the pad, based on the position of the latest probe mark region.
申请公布号 US7477064(B2) 申请公布日期 2009.01.13
申请号 US20060386747 申请日期 2006.03.23
申请人 TOKYO ELECTRON LIMITED 发明人 KURIHARA DAIKI;CHAYA HIROMI;HYAKUDOMI TAKANORI
分类号 G01R31/02;G01R31/28 主分类号 G01R31/02
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