发明名称 Vacuum prcessing apparatus and vacuum processing method of sample
摘要 A vacuum processing apparatus includes a vacuum container which can be depressurized, a sample holder inside of the vacuum container for mounting a sample to be processed, wherein films laid over a surface of the sample are etched with plasma generated in a space above the sample holder. The apparatus further includes a gas supply channel for feeding a heat conducting gas between a sample mounting surface and the backside of the sample, and a pressure control unit for changing stepwise the pressure of the gas supply channel between the sample mounting surface and the backside of the sample in accordance with the progress of the processing of the films of the sample by the etching.
申请公布号 US2009000741(A1) 申请公布日期 2009.01.01
申请号 US20080230465 申请日期 2008.08.29
申请人 ARAMAKI TOORU;TSUBONE TSUNEHIKO;KANEKIYO TADAMITSU;SHIRAYONE SHIGERU;KIHARA HIDEKI 发明人 ARAMAKI TOORU;TSUBONE TSUNEHIKO;KANEKIYO TADAMITSU;SHIRAYONE SHIGERU;KIHARA HIDEKI
分类号 C23F1/08 主分类号 C23F1/08
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