发明名称 SUBSTRATE RETAINING RING
摘要 <P>PROBLEM TO BE SOLVED: To provide a chemical-mechanical polishing device of optimizing polishing efficiency, flatness uniformity, and a degree of final finish while minimizing the risk of contamination or damages of a substrate. <P>SOLUTION: A substrate retaining ring 166 used for the polishing device comprises: a lower surface for abutting to a polishing pad 135 at the time of polishing; a cylindrical inner surface adjacently arranged to a peripheral part of a mounting surface for the substrate 113; and a transition area, positioned in a ring outer peripheral part, and provided between a first flat surface 124 substantially in parallel with a nominal flat surface of the polishing pad and a second flat surface 125 perpendicular to the nominal flat surface of the polishing pad. The substrate retaining ring is characterized by the transition area planarly inclined at 15-25 degrees to the parallel direction of the nominal flat surface of the polishing pad. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008302495(A) 申请公布日期 2008.12.18
申请号 JP20080207305 申请日期 2008.08.11
申请人 EBARA CORP 发明人 WANG HUEY-MING;MOLONEY GERARD S;CHIN SCOTT;GERAGHITY JOH J;DYSON WILLIAM JR;DICKEY TANLIN K
分类号 B24B37/30;B24B37/32;B24B49/16;H01L21/304 主分类号 B24B37/30
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