发明名称 DIAGNOSIS SYSTEM FOR ABNORMALITY
摘要 PURPOSE:To enable the early discovery of the abnormality in an instrument by disposing arrays heating elements at the beginning point for scanning, using the images thereof as a reference point, comparing the same with the analog-processed value of the thermogram of an object obtd. when the object is normal and diagnosing the presence or absence of the abnormality for the heat generation in each part of the object. CONSTITUTION:Diagnosis of an instrument 11 to be diagnosed is accomplished by installing an IR camera 14 in accordance with the base plate 12 of the instrument 11 in a operating state, and the IR rays radiated from the respective electronic parts on the base plate 12 are scanned and are detected with an IR sensor, by which thermogram pattern signal of the instrument 11 is obtd. The signal is inputted to a comparing arithmetic device 16 which compares the signal with the standard thermogram pattern signal from a storage device 20. The results of the comparison and calculation are recorded in a recorder 21 such as a printer. The results are also recorded in a video recorder 18 and are displayed on the image screen of a display device 19. A synchronizing marker 13 is disposed by scanning on the substrate 12 of the instrument 11 and is scanned and detected with the camera 14, by which the base point signal is obtd. in the specified position at every scanning and the synchronization in the stage of comparison and calculation is made easy.
申请公布号 JPS5950322(A) 申请公布日期 1984.03.23
申请号 JP19820160372 申请日期 1982.09.14
申请人 MITSUBISHI JUKOGYO KK 发明人 YAMAMOTO HISAYOSHI;GOTOU SHIGERU;TSUNEMITSU MASAO
分类号 G01J5/48;G01M99/00;(IPC1-7):01J5/48 主分类号 G01J5/48
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