| 摘要 |
PROBLEM TO BE SOLVED: To achieve a testing method and IC tester of a semiconductor integrated circuit capable of detecting a short between pins even when it is not a complete short. SOLUTION: In the testing method of the semiconductor integrated circuit for detecting a short between pins of the semiconductor integrated circuit having a plurality of pins, the IC tester or the semiconductor integrated circuit generates a pulse or step signal in a desired pin of the semiconductor integrated circuit, and the IC tester determines a short between pins based on the waveform from the pin of the semiconductor integrated circuit adjacent to the desired pin. COPYRIGHT: (C)2009,JPO&INPIT
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