发明名称 Self-Aligned Gate Structure, Memory Cell Array, and Methods of Making the Same
摘要 A self-aligned gate structure includes a first gate region and a second gate region. The first gate region extends in semiconductor substrate portions to a lesser depth than in isolation trenches that are adjacent to the semiconductor substrate portions. The first gate region comprises a first conductive material. The second gate region is adjacent to the first gate region and extends above a surface of the semiconductor substrate. The second gate region includes a second conductive material.
申请公布号 US2008258206(A1) 申请公布日期 2008.10.23
申请号 US20070736327 申请日期 2007.04.17
申请人 QIMONDA AG 发明人 HOFMANN FRANZ
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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