发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device that hardly causes a wrong cutoff of fuse circuit at the time of its trimming. SOLUTION: The semiconductor device has a semiconductor substrate, an interlayer insulating film, a nitride film, a first redundant circuit having a first via plug running through the nitride film and the interlayer insulating film and a first fuse electrically connected to this first via plug, and a second redundant circuit having a second via plug running through the nitride film and the interlayer insulating film, wherein an oxide film is intermediate between the first via plug and the nitride film, and between the second via plug and the nitride film, respectively. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008198939(A) 申请公布日期 2008.08.28
申请号 JP20070035127 申请日期 2007.02.15
申请人 ELPIDA MEMORY INC 发明人 NAKAMURA NOBUYUKI
分类号 H01L21/82;H01L21/768;H01L21/822;H01L23/522;H01L27/04 主分类号 H01L21/82
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