发明名称 SURFACE PROFILE MEASURING INSTRUMENT
摘要 A surface profile measuring instrument has a means for measuring the profile of a surface and a means for storing measurements produced by the means for measuring the profile of a surface. The instrument may have a tip physically coupled to a sensor. The instrument may also have means for processing the measurements and/or for analysing the measurements. The instrument may be connected to an external device such as a printer and/or to a display unit.
申请公布号 US2008208524(A1) 申请公布日期 2008.08.28
申请号 US20080034796 申请日期 2008.02.21
申请人 ELCOMETER INSTRUMENTS LIMITED 发明人 SELLARS IAN CARRINGTON;BALDWIN PETER IAN;MAY PHILIP ANTHONY;MORLEY COLIN JOHN;WILLIAMS BRIAN LESLIE;SELLARS MICHAEL CARRINGTON
分类号 G01B7/28 主分类号 G01B7/28
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