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发明名称
METHOD FOR INSPECTING SEMICONDUCTOR MEMORY
摘要
申请公布号
KR100838639(B1)
申请公布日期
2008.06.16
申请号
KR20067023295
申请日期
2006.11.07
申请人
发明人
分类号
G11C11/22;G11C5/14;G11C29/00
主分类号
G11C11/22
代理机构
代理人
主权项
地址
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